b Description AOI verification station for MLB PCB with min line/space down to 25+ µm. VVR, CIMS verification station combines virtual and physical verification within a single workstation. VVR for MLB is designed to support high volume manufacturing of MLB PCB. The...
b Description AOI for IC Substrates with min line/space down to 4 µm. Galaxy 4Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 4 µm line/space width...
b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 5 µm line/space width...
b Description AOI for IC Substrates with min line/space down to 7 µm. Galaxy 7Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 7 µm line/space width...
b Description AOI for IC Substrates and ultra fine line HDI with min line/space down to 10 µm. Galaxy 10Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of IC Substrates and ultra fine line HDI. It...
b Description AVI verification station for IC Substrates with min line/fingers down to 4 µm. SVS 4μ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
b Description AVI for IC Substrates with min line/space down to 5 µm. Capricorn 5Cx, CIMS latest generation AVI system, equipped with color camera, is designed for final inspection of fine line IC Substrates. It is capable to scan down to 5 µm line/space (1.6 μm...
b Description AVI for IC Substrates with min line/space down to 4 µm. Capricorn 4Cχ, CIMS latest generation AVI system, equipped with color camera, is designed for final inspection of fine line IC Substrates. It is capable to scan down to 4 µm line/space (1 μm optical...
b Description Panel final inspection for HDI and MLB PCB with min line/space down to 10 µm. Galaxy Fi 10Cχ, CIMS latest generation of AOI system, is designed to support final inspection of HDI and MLB PCB. It is capable to scan down to 15 µm line/space width...
b Description Panel final inspection for IC Substrates and ultra fine line HDI with min line/space down to 5 µm. Galaxy Fi 5Cχ, is a panel based final inspection system for IC Substrates and ultra fine line HDI, equipped with color camera and is designed to scan down...