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	<title>Angelnina He | CIMS</title>
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	<title>Angelnina He | CIMS</title>
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	<item>
		<title>Visit us in HKPCA show 2024</title>
		<link>https://www.cims.com/visit-us-in-hkpca-show-2024/</link>
					<comments>https://www.cims.com/visit-us-in-hkpca-show-2024/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 20 Nov 2024 00:30:00 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<category><![CDATA[AOI]]></category>
		<category><![CDATA[HKPCA]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13520</guid>

					<description><![CDATA[CIMS will be exhibiting at HKPCA 2024 in Shenzhen, China. Please, visit us between Dec.4th and 6th.]]></description>
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				<div class="et_pb_text_inner"><h3>CIMS will be exhibiting at HKPCA 2024 in Shenzhen, China, from December 4th to 6th. We invite you to visit us at our booth, 5D01.</h3>
<p>HKPCA is one of the largest PCB exhibitions in China, focusing on Southern China PCB cluster. This year, we’re excited to introduce Spark&#x2122; 4.0, our next-generation software inspection engine, featuring powerful new functionalities. Additionally, we’ll present our latest inspection solution designed for advanced IC substrates, capable of handling down to a 2-micron line/space.</p>
<p>We’re also thrilled to launch Ucamco&#8217;s (a CIMS group company) newest frontend software products, which include next-generation pre-CAM and full CAM solutions, along with advanced material handling automation for all PCB industry segments.</p>
<p>Stop by to discover our latest innovations!</div>
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		<title>New Product Launch &#8211; Quantum 2µ</title>
		<link>https://www.cims.com/newsletter-quantum-2%c2%b5/</link>
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		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 09 Oct 2024 16:34:00 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13515</guid>

					<description><![CDATA[CIMS AIVS – The Ultimate Virtual Verification Solution]]></description>
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						<h1 class="et_pb_module_header">CIMS Press Release</h1>
						
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				<div class="et_pb_text_inner"><h2><span lang="EN-US"><em>Quantum 2µ – the Ultimate Inspection Solution for 2 µm line/space IC Substrates</em><o:p></o:p></span></h2></div>
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				<span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="886" height="472" src="https://www.cims.com/wp-content/uploads/2024/10/Banner-Quantum-WEBSITE-01.jpg" alt="" title="Banner-Quantum - WEBSITE-01" srcset="https://www.cims.com/wp-content/uploads/2024/10/Banner-Quantum-WEBSITE-01.jpg 886w, https://www.cims.com/wp-content/uploads/2024/10/Banner-Quantum-WEBSITE-01-480x256.jpg 480w" sizes="(min-width: 0px) and (max-width: 480px) 480px, (min-width: 481px) 886px, 100vw" class="wp-image-13544" /></span>
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				<div class="et_pb_text_inner"><h3 style="text-align: justify;"><span style="font-size: 14px; color: #666666;"></span></h3>
<h3 style="text-align: justify;"><span style="font-size: 14px; color: #666666;"></span></h3>
<p align="left"><span>CIMS Quantum 2µ AOI is a revolutionary inspection solution for advanced IC substrates with lines and spaces as small as 2 µm. This system features submicron optical resolutions and incorporates cutting-edge technologies in illumination, image acquisition and processing, algorithms, and AI.</span></p>
<p align="left">
<p align="left"><span>Quantum 2µ is a new family of CIMS products designed for inspection of advanced products requiring ultra-high resolutions, stable image acquisition, superior detection, and low false calls rate.</span></p>
<p align="left">
<p align="left"><span>This system also includes Spark 4.0, CIMS&#8217;s latest generation of inspection engine with enhanced inspection and metrology capabilities, which represents a significant step forward and a new milestone in CIMS&#8217;s technological leadership in the industry. </span></p></div>
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			</item>
		<item>
		<title>New Product Launch &#8211; Spark 4.0</title>
		<link>https://www.cims.com/newsletter-spark-4-0/</link>
					<comments>https://www.cims.com/newsletter-spark-4-0/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Tue, 08 Oct 2024 01:00:08 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13510</guid>

					<description><![CDATA[CIMS AIVS – The Ultimate Virtual Verification Solution]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_3 et_pb_with_background et_pb_fullwidth_section et_section_regular" >
				
				
				
				
				
				
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				<div class="et_pb_text_inner"><h2><span lang="EN-US"><em>Spark 4.0: the Next Generation CIMS Software Inspection Engine</em><o:p></o:p></span></h2></div>
			</div><div class="et_pb_module et_pb_text et_pb_text_4  et_pb_text_align_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_text_inner"><h3><span style="font-size: 14px; color: #666666;"><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/Spark4-TM-01-300x110.png" width="300" height="110" alt="" class="wp-image-13610 alignnone size-medium" style="display: block; margin-left: auto; margin-right: auto;" /></span></h3>
<h3 style="text-align: justify;"><span style="font-size: 14px; color: #666666;">We&#8217;ve been working hard to upgrade and expand our product offerings with </span><span style="font-size: 14px; color: #666666;">new inspection technologies and fascinating cutting-edge breakthroughs. Spark 4.0, the latest version of CIMS software inspection engine, is the product of these ongoing efforts; it is filled with additional powerful capabilities that further improves Spark 3.0, CIMS renowned software inspection engine.</span><span style="font-size: 14px; color: #666666;"></span></h3>
<p><span style="font-size: 14px; color: #666666;"></span></p>
<p><em><span style="text-decoration: underline;"><span style="font-size: 14px; color: #666666;">Here are some of the key new features：</span></span></em></p></div>
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					<p><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/Blaze-TM-01-300x111.png" width="178" height="66" alt="" class="wp-image-13593 alignnone size-medium" style="display: block; margin-left: auto; margin-right: auto;" />
				</div> <div class='one_half et_column_last'>
					<h2><a href="https://www.cims.com/galaxy-flex-15μ/" target="_blank" rel="noopener"></a>BLAZE</h2>
<p><span>An innovative enhanced detection software that combines advanced zone analysis with powerful image processing algorithms</span>
				</div><div class='clear'></div></p></div>
			</div>
			</div><div class="et_pb_module et_pb_accordion et_pb_accordion_1">
				
				
				
				
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				<h5 class="et_pb_toggle_title"></h5>
				<div class="et_pb_toggle_content clearfix"><div class='one_half'>
					<p><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/LTI-TM___-1-300x125.png" width="178" height="74" alt="" class="wp-image-13597 alignnone size-medium" style="display: block; margin-left: auto; margin-right: auto;" />
				</div> <div class='one_half et_column_last'>
					<h2><a href="https://www.cims.com/galaxy-flex-15μ/" target="_blank" rel="noopener"></a>LTI</h2>
<p><span>A dedicated detection method with statistics capabilities offers most versatile laser trench/slot inspection solution</span>
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					<p><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/AI-inside-TM-01-300x64.png" width="192" height="41" alt="" class="wp-image-13589 alignnone size-medium" style="display: block; margin-left: auto; margin-right: auto;" />
				</div> <div class='one_half et_column_last'>
					<h2><a href="https://www.cims.com/galaxy-flex-15μ/" target="_blank" rel="noopener"></a><span>AI inside</span></h2>
<p><span>A built-in AI pre-processing that runs on AOI as a stand-alone or in a combination with AI post-processing</span>
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			</div>
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					<p><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/2MM-TM___-1-300x108.png" width="167" height="60" alt="" class="wp-image-13601 alignnone size-medium" style="display: block; margin-left: auto; margin-right: auto;" />
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					<h2><a href="https://www.cims.com/galaxy-flex-15μ/" target="_blank" rel="noopener"></a><span>2MM</span></h2>
<p><span>The latest 2D metrology option providing accurate measurements of traces and spaces at all critical locations during AOI scanning</span>
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				<div class="et_pb_toggle_content clearfix"><p><img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/1_画板-1-300x148.png" width="122" height="60" alt="" class="wp-image-13648 alignnone size-medium" /> <img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/2_画板-1-300x114.png" width="174" height="66" alt="" class="wp-image-13652 alignnone size-medium" /> <img decoding="async" loading="lazy" src="https://www.cims.com/wp-content/uploads/2024/11/3_画板-1-1-300x94.png" width="189" height="59" alt="" class="wp-image-13660 alignnone size-medium" /></p>
<p><span>In addition, Spark 4.0 includes other new tech integration in image acquisition and processing, data collection and Industry 4.0 compatibility</span>[/one_half_last]</p></div>
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			</div></p>
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		<item>
		<title>Visit us in TPCA show 2024</title>
		<link>https://www.cims.com/visit-us-in-tpca-show-2024/</link>
					<comments>https://www.cims.com/visit-us-in-tpca-show-2024/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 25 Sep 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<category><![CDATA[AOI]]></category>
		<category><![CDATA[TPCA]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13460</guid>

					<description><![CDATA[CIMS will be exhibiting at TPCA 2024 in Taipei. Please, visit us on October 23rd-25th]]></description>
										<content:encoded><![CDATA[<div class="et_pb_section et_pb_section_5 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_4">
				<div class="et_pb_column et_pb_column_4_4 et_pb_column_4  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_text et_pb_text_5  et_pb_text_align_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_text_inner"><h3>CIMS will be exhibiting at TPCA 2024 in Taipei. Visit us on October 23rd-25th.</h3>
<p>The TPCA is Taiwan&#8217;s main annual PCB event. This year, it takes place in Taipei on 23-25 October.</p>
<p>This year, we are showcasing several innovative products and solutions that will undoubtedly benefit our customers. This time, we are formally introducing Spark<strong>&#x2122;</strong> 4.0, a next-generation software inspection engine packed with new and powerful functionalities. We are also presenting the latest inspection solution for the most advanced segment of IC substrates, down to a 2-micron line/space.</p>
<p>Moreover, we are also launching the latest frontend software products by Ucamco, a CIMS group company, that represent the next generation of pre-CAM and full CAM products as well as highly advanced material handling automation solutions for all segments of PCB industry.</p>
<p>We will be exhibiting in booth L513. Visit us and learn more about our latest products.</p></div>
			</div><div class="et_pb_module et_pb_image et_pb_image_2">
				
				
				
				
				<a href="https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-scaled.jpg" class="et_pb_lightbox_image" title=""><span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="2560" height="1089" src="https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-scaled.jpg" alt="" title="2024 TPCA Invitation_EN" srcset="https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-scaled.jpg 2560w, https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-1280x545.jpg 1280w, https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-980x417.jpg 980w, https://www.cims.com/wp-content/uploads/2024/09/2024-TPCA-Invitation_EN-480x204.jpg 480w" sizes="(min-width: 0px) and (max-width: 480px) 480px, (min-width: 481px) and (max-width: 980px) 980px, (min-width: 981px) and (max-width: 1280px) 1280px, (min-width: 1281px) 2560px, 100vw" class="wp-image-13469" /></span></a>
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			</item>
		<item>
		<title>Visit us in IPCA show 2024</title>
		<link>https://www.cims.com/visit-us-in-ipca-show-2024/</link>
					<comments>https://www.cims.com/visit-us-in-ipca-show-2024/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Fri, 30 Aug 2024 01:44:35 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<category><![CDATA[AOI]]></category>
		<category><![CDATA[IPCA]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13288</guid>

					<description><![CDATA[CIMS will be exhibiting at IPCA 2024 in Delhi, India. Visit us between Sep. 11th and 13th]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_6 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_5">
				<div class="et_pb_column et_pb_column_4_4 et_pb_column_5  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_text et_pb_text_6  et_pb_text_align_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_text_inner"><h3>CIMS will be exhibiting at IPCA 2024 in Delhi, India. Visit us between Sep. 11th and 13th</h3>
<h3></h3>
<p>IPCA is the main PCB trade show for the Indian market that is attended by large number of local and foreign visitors. We will be presenting our latest inspection products as well as software and smart factory solutions developed by both CIMS and Ucamco which is now a part of CIMS group. Our partner, Polar India is now representing both CIMS and Ucamco in the Indian market.</p>
<p>Please, visit us between September 11 and 13 at booth <span style="color: #339966;">H12N27</span> (Polar India).</div>
			</div><div class="et_pb_module et_pb_image et_pb_image_3">
				
				
				
				
				<a href="https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN.jpg" class="et_pb_lightbox_image" title=""><span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="1417" height="592" src="https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN.jpg" alt="" title="2024 India PCB Invitation_EN" srcset="https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN.jpg 1417w, https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN-1280x535.jpg 1280w, https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN-980x409.jpg 980w, https://www.cims.com/wp-content/uploads/2024/08/2024-India-PCB-Invitation_EN-480x201.jpg 480w" sizes="(min-width: 0px) and (max-width: 480px) 480px, (min-width: 481px) and (max-width: 980px) 980px, (min-width: 981px) and (max-width: 1280px) 1280px, (min-width: 1281px) 1417px, 100vw" class="wp-image-13305" /></span></a>
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			</item>
		<item>
		<title>Visit us in KPCA show 2024</title>
		<link>https://www.cims.com/visit-us-in-kpca-show-2024/</link>
					<comments>https://www.cims.com/visit-us-in-kpca-show-2024/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 21 Aug 2024 06:09:43 +0000</pubDate>
				<category><![CDATA[News]]></category>
		<category><![CDATA[AOI]]></category>
		<category><![CDATA[KPCA]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=13246</guid>

					<description><![CDATA[CIMS will be exhibiting at KPCA 2024 in Incheon, Korea. Visit us between Sep. 4th and 6th]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_8 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_6">
				<div class="et_pb_column et_pb_column_4_4 et_pb_column_6  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_text et_pb_text_7  et_pb_text_align_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_text_inner"><h3>CIMS will be exhibiting at KPCA 2024 in Incheon, Korea. Visit us between Sep. 4th and 6th</h3>
<h3></h3>
<p>CIMS will exhibit at KPCA 2024 in Incheon, Korea. Visit us between September 4th and 6th.</p>
<p>The KPCA is Korea&#8217;s main annual PCB event. This year, it will be held in Incheon from September 4th to 6th. This time, we&#8217;re highlighting our cutting-edge inspection solutions for advanced IC substrates, as well as turnkey software solutions for smart factories.</p>
<p>We&#8217;ll be at booth <span style="color: #339966;">#510</span> with our partner, AKC. Come visit us to learn more about the latest CIMS products for the Korean market.</p></div>
			</div><div class="et_pb_module et_pb_image et_pb_image_4">
				
				
				
				
				<a href="https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN.jpg" class="et_pb_lightbox_image" title=""><span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="1417" height="592" src="https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN.jpg" alt="" title="2024 KPCA Invitation_EN" srcset="https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN.jpg 1417w, https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN-1280x535.jpg 1280w, https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN-980x409.jpg 980w, https://www.cims.com/wp-content/uploads/2024/08/2024-KPCA-Invitation_EN-480x201.jpg 480w" sizes="(min-width: 0px) and (max-width: 480px) 480px, (min-width: 481px) and (max-width: 980px) 980px, (min-width: 981px) and (max-width: 1280px) 1280px, (min-width: 1281px) 1417px, 100vw" class="wp-image-13251" /></span></a>
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			</div></p>
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			</item>
		<item>
		<title>AIVR 4μ</title>
		<link>https://www.cims.com/aivr-4u/</link>
					<comments>https://www.cims.com/aivr-4u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 08:25:21 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[4 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12448</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_10 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_7">
				<div class="et_pb_column et_pb_column_1_3 et_pb_column_7  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/08/AIVR-4μ-300x300-1.png" alt="" title="AIVR 4μ-300x300" /></span>
			</div>
			</div><div class="et_pb_column et_pb_column_2_3 et_pb_column_8  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_0  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for IC Substrates with min line/space down to 4 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 4μ is compatible with all CIMS AOI.</p></div>
					</div>
				</div>
			</div>
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			</div><div class="et_pb_section et_pb_section_11 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_8">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_9  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_1  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_10  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_2  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
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			</div>
				
				
			</div><div class="et_pb_section et_pb_section_12 et_section_regular" >
				
				
				
				
				
				
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				<div class="et_pb_module et_pb_text et_pb_text_8  et_pb_text_align_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_text_inner"><h3><span style="color: #4f8c5b;">Similar products:</span></h3>
<p><div class="pt-cv-wrapper et_smooth_scroll_disabled"><div class="pt-cv-view pt-cv-grid pt-cv-colsys" id="pt-cv-view-33ef97cguk"><div data-id="pt-cv-page-1" class="pt-cv-page" data-cvc="5"><div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-4u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/08/AIVR-4μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-15u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-15u/" class="_self" target="_self" >AIVR 15μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-30u/" class="_self" target="_self" >AIVR 30μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-7u/" class="_self" target="_self" >AIVR 7μ</a></h4></div></div></div></div>
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				<div class="et_pb_row et_pb_row_10">
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				<h1 class="et_pb_contact_main_title">Ask us for more information</h1>
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				<div class="et_pb_contact">
					<form class="et_pb_contact_form clearfix" method="post" action="https://www.cims.com/author/angelnina/feed/">
						<p class="et_pb_contact_field et_pb_contact_field_6 et_pb_contact_field_half" data-id="name" data-type="input">
				
				
				
				
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		<item>
		<title>AIVR 30μ</title>
		<link>https://www.cims.com/aivr-30u/</link>
					<comments>https://www.cims.com/aivr-30u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[30 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12969</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 30μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 30 ~ 100 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_14 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-30μ-300x300-1.png" alt="" title="AIVR 30μ-300x300" /></span>
			</div>
			</div><div class="et_pb_column et_pb_column_2_3 et_pb_column_14  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 30 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 30μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 30 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 30μ is compatible with all CIMS AOI.</div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_15 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_12">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_15  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_4  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_16  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_5  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_16 et_section_regular" >
				
				
				
				
				
				
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				<div class="et_pb_text_inner"><h3><span style="color: #4f8c5b;">Similar products:</span></h3>
<p><div class="pt-cv-wrapper et_smooth_scroll_disabled"><div class="pt-cv-view pt-cv-grid pt-cv-colsys" id="pt-cv-view-33ef97cguk"><div data-id="pt-cv-page-1" class="pt-cv-page" data-cvc="5"><div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-4u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/08/AIVR-4μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-15u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-15u/" class="_self" target="_self" >AIVR 15μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-30u/" class="_self" target="_self" >AIVR 30μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-7u/" class="_self" target="_self" >AIVR 7μ</a></h4></div></div></div></div>
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				<h1 class="et_pb_contact_main_title">Ask us for more information</h1>
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		<item>
		<title>AIVR 25μ</title>
		<link>https://www.cims.com/aivr-25u/</link>
					<comments>https://www.cims.com/aivr-25u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[25 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12967</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 25 ~ 100 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_18 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_15">
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-25μ-300x300-1.png" alt="" title="AIVR 25μ-300x300" /></span>
			</div>
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				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 25 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 25 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 25μ is compatible with all CIMS AOI.</div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
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						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
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<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
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<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
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		<title>AIVR 15μ</title>
		<link>https://www.cims.com/aivr-15u/</link>
					<comments>https://www.cims.com/aivr-15u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[15 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12965</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 15μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 15 ~ 100 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_22 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1.png" alt="" title="AIVR 15μ-300x300" /></span>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for  HDI and IC Substrates with min line/space down to 15 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 15μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 15 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 15μ is compatible with all CIMS AOI.</div>
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						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
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					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
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