AOI system for plugged via holes (PVH) inspection with min diameter down to 75 µm.

Galaxy PVH is designed to inspect plugged via holes that are typically filled with resin in high volume manufacturing of MLB and HDI PCB.

The process of plugging drills typically involves resin or other materials and is done on mechanical drills as well as laser via. CIMS PVH option extends AOI capabilities to inspecting both types of drills delivering reliable detection of all defects within such drills. The system is designed to inspect both filled through holes as well filled laser via holes on the same panel.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Galaxy PVH is the perfect solution for customers who are looking for reliable and accurate tool to control the depth of resin within each drill with sufficiently fast throughput to match high volume production.

Powerful statistical packages further extend capabilities of Galaxy PVH series providing real time process control used for laser drill tool calibration.

PVH option is an add-on functionality for selected CIMS AOI models enabling inspection of plugged via holes down to 75 microns in diameter. This new system further extends CIMS line of products an options for drill inspection applications.

The process of plugging drills typically involves resin or other materials and is done on mechanical drills as well as laser via. CIMS PVH option extends AOI capabilities to inspecting both types of drills delivering reliable detection of all defects within such drills.

PVH option is the perfect solution for customers who are looking for reliable and accurate tool to control the depth of resin within each drill with sufficiently fast throughput to match high volume production.

CQC, which stands for CIMS Quality Center, is the live quality monitoring tool that allows users to have an up-to-the-minute view of ongoing quality-related issues based on data generated by AOI in real time.

How does CQC work?

CQC is a software that runs on a stand alone standard computer that must be linked to CDBIC server in order to retrieve data from AOI and CVR systems. The display options are very flexible in order to accommodate various types of users and preferences.

For example, a QA manager may be interested in defects distribution statistics and trends, current yield, defects maps and clustering of specific types of defects on a panel. On the other hand, a production manager may choose to focus on equipment utilization data or total panels scanned and verified. An AOI supervisor can configure a view that shows current equipment status, average total calls trends or each individual throughput data.

All those different views and preferences can be easily configured per user with practically unlimited customization options making CQC an invaluable tool for every level of PCB manufacturing operation.

AOI systems for through laser via inspection with min diameter down to 20 µm.

Galaxy VIA series represent the family of models designed to support inspection of through laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems within this family include the following models:

• Galaxy VIA 20µ for inspection of via holes down to 20 µm in diameter
• Galaxy VIA 25µ for inspection of via holes down to 25 µm in diameter
• Galaxy VIA 30µ for inspection of via holes down to 30 µm in diameter

The systems’ illumination is powered by unique ViaLight™ technology providing transmissive light source built-in within the scanning table. The optional Microlight™ illumination provides simultaneous light coverage from the top ensuring the most accurate and complete acquisition of external and internal shape of a through via hole.

The systems within Galaxy VIA series are capable of inspecting through laser via drills as small as 20 microns in diameter, detect undersize and oversize defects, contamination and debris inside, plugged or missing holes as well as drill shifts beyond allowable tolerance.

Powerful statistical packages further extend capabilities of Galaxy VIA series providing real time process control used for laser drill tool calibration.