Hybrid-mode AOI verification station for MLB PCB with min line/space down to 25+ µm.

VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for MLB is designed to support high volume manufacturing of MLB PCB. The systems within this series include the following models:

• VVR 25μ is optimized for verification of 25 µm line/space width technology
• VVR 30μ is optimized for verification of 30 µm line/space width technology

In VVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with advanced image enhancement algorithms enabling quick filtering out obvious false calls.

Using VVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.

VVR for MLB is compatible with all CIMS AOI.

Panel final inspection for advanced IC Substrates and ultra fine line HDI with min line/space down to 10 µm.

Galaxy Fi 10Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of advanced IC Substrates and ultra fine line HDI. It is equipped with color camera and capable to scan down to 10 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 10Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Panel final inspection for standard IC Substrates, HDI and MLB PCB with min line/space down to 15 µm.

Galaxy Fi 15Cμ, CIMS latest panel based final inspection system, is designed to support final inspection of standard IC Substrates, HDI and MLB PCB. It is equipped with color camera and capable to scan down to 15 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 15Cμ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

AOI for HDI and multi-layer PCB with min line/space down to 30 µm.

Galaxy 30μ, CIMS AOI system, is designed to support high volume manufacturing of HDI and multi-layer PCB. It is capable to scan down to 30 µm line/space width technology.

The system’s state of the art optical technology Microlight™ Gen II provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Galaxy 30μ is powered by Spark™ 3.0 – CIMS latest generation cross-platform detection engine.

Hybrid-mode AOI verification station for HDI PCB with min line/space down to 15 µm.

VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for HDI is designed to support high volume manufacturing of HDI PCB. The systems within this series include the following models:

• VVR 15μ is optimized for verification of 15 µm line/space width technology
• VVR 25μ is optimized for verification of 25 µm line/space width technology
• VVR 30μ is optimized for verification of 30 µm line/space width technology

In VVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with advanced image enhancement algorithms enabling quick filtering out obvious false calls.

Using VVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.

VVR for HDI is compatible with all CIMS AOI.

AOI system for plugged via holes (PVH) inspection with min diameter down to 75 µm.

Galaxy PVH is designed to inspect plugged via holes that are typically filled with resin in high volume manufacturing of MLB and HDI PCB.

The process of plugging drills typically involves resin or other materials and is done on mechanical drills as well as laser via. CIMS PVH option extends AOI capabilities to inspecting both types of drills delivering reliable detection of all defects within such drills. The system is designed to inspect both filled through holes as well filled laser via holes on the same panel.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Galaxy PVH is the perfect solution for customers who are looking for reliable and accurate tool to control the depth of resin within each drill with sufficiently fast throughput to match high volume production.

Powerful statistical packages further extend capabilities of Galaxy PVH series providing real time process control used for laser drill tool calibration.

AOI for large panel inspection with min line/space down to 40 µm.

Phoenix LT, CIMS AOI system, is designed for inspection of large panel of up to 36″ x 42″ (914 mm x 1,067 mm). It is capable to scan down to 40 µm line/space width technology.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Phoenix LT is powered by Spark™ – an innovative cross-platform detection engine.

AOI for inspection of mechanical drills down to 150 µm in diameter.

Phoenix MDI, CIMS AOI system, is designed for inspection of mechanical drills on HDI and multi-layer PCB. It is capable to scan mechanical drills down to 150 µm in diameter.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix MDI is powered by Spark™ – an innovative cross-platform detection engine.

AOI for HDI and MLB PCB photo-tools with min line/space down to 25 µm.

Phoenix PT, CIMS AOI system, is designed to inspect photo-tools such as film artworks as well as glass mask. It is capable to scan down to 25 µm line/space width technology.

Since masks are used with transmissive light, Phoenix PT inspection system implements the same light path for inspection ensuring reliable detection of defects that could otherwise be transferred to panels produced with defective masks. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix PT is powered by Spark™ – an innovative cross-platform detection engine.