Panel final inspection for advanced IC Substrates and ultra fine line HDI with min line/space down to 10 µm.

Galaxy Fi 10Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of advanced IC Substrates and ultra fine line HDI. It is equipped with color camera and capable to scan down to 10 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 10Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Panel final inspection for highly advanced IC Substrates and ultra fine line HDI with min line/space down to 5 µm.

Galaxy Fi 5Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of highly advanced IC Substrates and ultra fine line HDI. It is equipped with color camera and capable to scan down to 5 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 5Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Panel final inspection for advanced IC Substrates and ultra fine line HDI with min line/space down to 7 µm.

Galaxy Fi 7Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of advanced IC Substrates and ultra fine line HDI. It is equipped with color camera and capable to scan down to 7 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 7Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Panel final inspection for standard IC Substrates, HDI and MLB PCB with min line/space down to 15 µm.

Galaxy Fi 15Cμ, CIMS latest panel based final inspection system, is designed to support final inspection of standard IC Substrates, HDI and MLB PCB. It is equipped with color camera and capable to scan down to 15 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 15Cμ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

AOI systems for laser via inspection with min diameter down to 10 µm.

Galaxy LV series represent the family of models designed to support inspection of blind laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems within this family include the following models:

• Galaxy LV 10x for inspection of via holes down to 10 µm in diameter
• Galaxy LV 15x for inspection of via holes down to 15 µm in diameter
• Galaxy LV 20x for inspection of via holes down to 20 µm in diameter
• Galaxy LV 25x for inspection of via holes down to 25 µm in diameter

The systems’ state of the art optical technology is specifically designed and calibrated to achieve optimal image acquisition of laser drills both before and after plating as well as conformal mask applications. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Galaxy LV series systems are powered by Spark™ 3.0 – an innovative cross-platform detection engine.

AOI system for plugged via holes (PVH) inspection with min diameter down to 75 µm.

Galaxy PVH is designed to inspect plugged via holes that are typically filled with resin in high volume manufacturing of MLB and HDI PCB.

The process of plugging drills typically involves resin or other materials and is done on mechanical drills as well as laser via. CIMS PVH option extends AOI capabilities to inspecting both types of drills delivering reliable detection of all defects within such drills. The system is designed to inspect both filled through holes as well filled laser via holes on the same panel.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Galaxy PVH is the perfect solution for customers who are looking for reliable and accurate tool to control the depth of resin within each drill with sufficiently fast throughput to match high volume production.

Powerful statistical packages further extend capabilities of Galaxy PVH series providing real time process control used for laser drill tool calibration.

AOI systems for through laser via inspection with min diameter down to 20 µm.

Galaxy VIA series represent the family of models designed to support inspection of through laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems within this family include the following models:

• Galaxy VIA 20µ for inspection of via holes down to 20 µm in diameter
• Galaxy VIA 25µ for inspection of via holes down to 25 µm in diameter
• Galaxy VIA 30µ for inspection of via holes down to 30 µm in diameter

The systems’ illumination is powered by unique ViaLight™ technology providing transmissive light source built-in within the scanning table. The optional Microlight™ illumination provides simultaneous light coverage from the top ensuring the most accurate and complete acquisition of external and internal shape of a through via hole.

The systems within Galaxy VIA series are capable of inspecting through laser via drills as small as 20 microns in diameter, detect undersize and oversize defects, contamination and debris inside, plugged or missing holes as well as drill shifts beyond allowable tolerance.

Powerful statistical packages further extend capabilities of Galaxy VIA series providing real time process control used for laser drill tool calibration.

AOI for inspection of mechanical drills down to 150 µm in diameter.

Phoenix MDI, CIMS AOI system, is designed for inspection of mechanical drills on HDI and multi-layer PCB. It is capable to scan mechanical drills down to 150 µm in diameter.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix MDI is powered by Spark™ – an innovative cross-platform detection engine.

AOI for inspection of touch screen panels down to 25 µm line/space width.

Phoenix Touch, CIMS AOI system, is designed for inspection of conductors on touch screen panels. It is capable to scan down to 25 µm line/space width technology.

The system’s state of the art optical technology Microlight™ provides optimal light coverage in order to achieve maximum contrast on touch screen conductor material. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix Touch is powered by Spark™ – an innovative cross-platform detection engine.

AOI for ultra fine line photo-tools with min line/space down to 7 µm.

Phoenix PT/Micro, CIMS AOI system, is designed to inspect ultra fine line photo-tools such as film artworks as well as glass mask. It is capable to scan down to 7 µm line/space width technology.

Since masks are used with transmissive light, Phoenix PT/Micro inspection system implements the same light path for inspection ensuring reliable detection of defects that could otherwise be transferred to panels produced with defective masks. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix PT/Micro is powered by Spark™ – an innovative cross-platform detection engine.