25 micron | CIMS https://www.cims.com Creativity in Motion Mon, 05 Aug 2024 03:27:20 +0000 en-US hourly 1 https://wordpress.org/?v=6.1.9 https://www.cims.com/wp-content/uploads/2017/08/cropped-CIMS-e1502874599572-32x32.png 25 micron | CIMS https://www.cims.com 32 32 AIVR 25μ https://www.cims.com/aivr-25u/ https://www.cims.com/aivr-25u/#respond Mon, 01 Jul 2024 01:00:00 +0000 https://www.cims.com/?p=12967
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Description

AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 25 µm.

AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 25 ~ 100 µm line/space width technology.

In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.

Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.

AIVR 25μ is compatible with all CIMS AOI.

Highlights

  • Combines verification of AOI post-processed images with live video mode
  • Up to 90% increase in verification efficiency vs. traditional mode
  • Displaying AI-enhanced high resolution color defects’ images grabbed directly from AOI
  • Variable zoom and automated calibration
  • Stationary vacuum table
  • Ergonomic design
  • Clear defect image and adjustable video light
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Options

  • Auto-marker for marking defects
  • Barcode reader
  • Adjustable monitor arm
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • SharpLight™ – enhanced video image

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12 + 10 =

]]> https://www.cims.com/aivr-25u/feed/ 0 Galaxy R2R 25μ https://www.cims.com/galaxy-r2r-25u/ https://www.cims.com/galaxy-r2r-25u/#respond Thu, 03 Jun 2021 06:46:38 +0000 https://www.cims.com/?p=6298
CIMS Galaxy R2R 25µ
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Description

AOI for inspection of FPC in roll-to-roll process with min line/space down to 25 µm.

Galaxy R2R 25µ, CIMS AOI system, is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 25 µm line/space width technology.

The system’s state of the art optical technology Microlight™ Gen II provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Galaxy R2R 25µ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Highlights

  • Linear motors for smooth & silent motion
  • Compact mechanical platform
  • High performance image processing firmware
  • Enhanced illumination block
  • Fast and intuitive setup for new jobs
  • Compatible with front AMHS automation or robot
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Options

  • +2DM™ metrology – panel dimensions measurement
  • +2CD™ metrology – 2D measurement of circuit elements
  • LDI™ – laser drill inspection option
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • VVS™ – virtual verification system

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]]> https://www.cims.com/galaxy-r2r-25u/feed/ 0 Galaxy Flex 25μ https://www.cims.com/galaxy-flex-25u/ https://www.cims.com/galaxy-flex-25u/#respond Thu, 03 Jun 2021 06:28:20 +0000 https://www.cims.com/?p=6279
CIMS Galaxy Flex 25μ
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Description

AOI for inspection of flex and rigid-flex with min line/space down to 25 µm.

Galaxy Flex 25μ, CIMS AOI system, is designed to support high volume manufacturing of flex and rigid-flex PCB. It is capable to scan down to 25 µm line/space width technology.

The system’s state of the art optical technology Microlight™ Gen II provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Flex 25μ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Highlights

  • Linear motors for smooth & silent motion
  • Compact mechanical platform
  • High performance image processing firmware
  • Enhanced illumination block
  • Fast and intuitive setup for new jobs
  • Compatible with front AMHS automation or robot
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Options

  • +2DM™ metrology – panel dimensions measurement
  • +2CD™ metrology – 2D measurement of circuit elements
  • LDI™ – laser drill inspection option
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • VVS™ – virtual verification system

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7 + 5 =

]]> https://www.cims.com/galaxy-flex-25u/feed/ 0 Galaxy 25μ https://www.cims.com/galaxy-25u/ https://www.cims.com/galaxy-25u/#respond Wed, 21 Apr 2021 03:15:27 +0000 https://www.cims.com/?p=5812
CIMS Galaxy 25µ
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Description

AOI for HDI and multi-layer PCB with min line/space down to 25 µm.

Galaxy 25μ, CIMS AOI system, is designed to support high volume manufacturing of HDI and high-end multi-layer PCB. It is capable to scan down to 25 µm line/space width technology.

The system’s state of the art optical technology Microlight™ Gen II provides optimal light coverage in order to be able to meet the most rigorous detection requirements. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Galaxy 25μ is powered by Spark™ 3.0 – CIMS latest generation cross-platform detection engine.

 

Highlights

  • Linear motors for smooth & silent motion
  • Compact mechanical platform
  • High performance image processing firmware
  • Enhanced illumination block
  • Fast and intuitive setup for new jobs
  • Compatible with front AMHS automation or robot
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Options

  • Fi™ – final inspection option for finished boards
  • +2DM™ metrology – panel dimensions measurement
  • +2CD™ metrology – 2D measurement of circuit elements
  • LDI™ – laser drill inspection option
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • VVS™ – virtual verification system

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14 + 15 =

]]> https://www.cims.com/galaxy-25u/feed/ 0 Phoenix PT https://www.cims.com/phoenix-pt/ https://www.cims.com/phoenix-pt/#respond Tue, 05 Sep 2017 12:19:40 +0000 http://www.cims.com/?p=515
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Description

AOI for HDI and MLB PCB photo-tools with min line/space down to 25 µm.

Phoenix PT, CIMS AOI system, is designed to inspect photo-tools such as film artworks as well as glass mask. It is capable to scan down to 25 µm line/space width technology.

Since masks are used with transmissive light, Phoenix PT inspection system implements the same light path for inspection ensuring reliable detection of defects that could otherwise be transferred to panels produced with defective masks. Optimized performance is achieved by combining superior image quality with customizable detection algorithms.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Phoenix product family is renown for its exceptional detection achieved with lowest possible false calls rate.

Phoenix PT is powered by Spark™ – an innovative cross-platform detection engine.

Highlights

  • Clear or matte glass table
  • Compatible with wide range of frames
  • Suitable for both glass masks and film artworks
  • Robust mechanical structure
  • Highly ergonomic design
  • High performance image processing firmware
  • Powerful processors to handle large data
  • Fast and intuitive setup for new jobs
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Options

  • Multiple glass mask frame sizes
  • Universal frame adaptor
  • Integrated height tracker
  • +2CD™ metrology – 2D measurement of circuit elements
  • CDB™/CDBIC™ – defects classification and virtual defects mapping

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