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	<title>AOI verification | CIMS</title>
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	<title>AOI verification | CIMS</title>
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		<title>AIVR 4μ</title>
		<link>https://www.cims.com/aivr-4u/</link>
					<comments>https://www.cims.com/aivr-4u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 08:25:21 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[4 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12448</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_0 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/08/AIVR-4μ-300x300-1.png" alt="" title="AIVR 4μ-300x300" /></span>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for IC Substrates with min line/space down to 4 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 4μ is compatible with all CIMS AOI.</p></div>
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			</div><div class="et_pb_section et_pb_section_1 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
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				<div class="et_pb_text_inner"><h3><span style="color: #4f8c5b;">Similar products:</span></h3>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div></div></div>
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		<item>
		<title>AIVR 25μ</title>
		<link>https://www.cims.com/aivr-25u/</link>
					<comments>https://www.cims.com/aivr-25u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[25 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12967</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 25 ~ 100 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_4 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-25μ-300x300-1.png" alt="" title="AIVR 25μ-300x300" /></span>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 25 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 25 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 25μ is compatible with all CIMS AOI.</div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_5 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_5">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_8  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_4  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_9  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
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				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
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		<title>AIVR 30μ</title>
		<link>https://www.cims.com/aivr-30u/</link>
					<comments>https://www.cims.com/aivr-30u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[30 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12969</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 30μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 30 ~ 100 µm line/space width technology.]]></description>
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-30μ-300x300-1.png" alt="" title="AIVR 30μ-300x300" /></span>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 30 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 30μ is designed to support high volume manufacturing of HDI and multi-layer PCB and optimized for verification of 30 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 30μ is compatible with all CIMS AOI.</div>
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						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
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						<h4 class="et_pb_module_header"><span>Options</span></h4>
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<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
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				<h1 class="et_pb_contact_main_title">Ask us for more information</h1>
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		<title>AIVR 7μ</title>
		<link>https://www.cims.com/aivr-7u/</link>
					<comments>https://www.cims.com/aivr-7u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[7 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12961</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 7μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 7 ~ 25 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_12 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-7μ-300x300-1.png" alt="" title="AIVR 7μ-300x300" /></span>
			</div>
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				<div class="et_pb_module et_pb_blurb et_pb_blurb_9  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for IC Substrates with min line/space down to 7 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 7μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 7 ~ 25 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 7μ is compatible with all CIMS AOI.</p></div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_13 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_13">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_20  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_10  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_21  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_11  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
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			</div>
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				<div class="et_pb_text_inner"><h3><span style="color: #4f8c5b;">Similar products:</span></h3>
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		<title>AIVR 5μ</title>
		<link>https://www.cims.com/aivr-5u/</link>
					<comments>https://www.cims.com/aivr-5u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[5 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12959</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 5μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 5 ~ 25 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_16 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-5μ-300x300-1.png" alt="" title="AIVR 5μ-300x300" /></span>
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				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for IC Substrates with min line/space down to 5 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 5μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 5 ~ 25 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 5μ is compatible with all CIMS AOI.</p></div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_17 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_17">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_26  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_13  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
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					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
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						<h4 class="et_pb_module_header"><span>Options</span></h4>
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<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
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		<title>AIVR 10μ</title>
		<link>https://www.cims.com/aivr-10u/</link>
					<comments>https://www.cims.com/aivr-10u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[10 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12963</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 10μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 10 ~ 25 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_20 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_20">
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-10μ-300x300-1.png" alt="" title="AIVR 10μ-300x300" /></span>
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				<div class="et_pb_module et_pb_blurb et_pb_blurb_15  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for  HDI and IC Substrates with min line/space down to 10 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 10μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 10 ~ 25 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 10μ is compatible with all CIMS AOI.</div>
					</div>
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				<div class="et_pb_column et_pb_column_1_2 et_pb_column_32  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
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					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_33  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
				</div>
			</div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div></div></div>
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				<h1 class="et_pb_contact_main_title">Ask us for more information</h1>
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		<item>
		<title>AIVR 15μ</title>
		<link>https://www.cims.com/aivr-15u/</link>
					<comments>https://www.cims.com/aivr-15u/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 01 Jul 2024 01:00:00 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[15 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=12965</guid>

					<description><![CDATA[AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 15μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 15 ~ 100 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_24 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1.png" alt="" title="AIVR 15μ-300x300" /></span>
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				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>AI-powered AOI verification station for  HDI and IC Substrates with min line/space down to 15 µm.</h5>
<p>AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 15μ is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 15 ~ 100 µm line/space width technology.</p>
<p>In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>AIVR 15μ is compatible with all CIMS AOI.</div>
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			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_25 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_25">
				<div class="et_pb_column et_pb_column_1_2 et_pb_column_38  et_pb_css_mix_blend_mode_passthrough">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_19  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 90% increase in verification efficiency vs. traditional mode</li>
<li>Displaying AI-enhanced high resolution color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
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			</div>
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				<div class="et_pb_module et_pb_blurb et_pb_blurb_20  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
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				<div class="et_pb_text_inner"><h3><span style="color: #4f8c5b;">Similar products:</span></h3>
<p><div class="pt-cv-wrapper et_smooth_scroll_disabled"><div class="pt-cv-view pt-cv-grid pt-cv-colsys" id="pt-cv-view-33ef97cguk"><div data-id="pt-cv-page-1" class="pt-cv-page" data-cvc="5"><div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-4u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/08/AIVR-4μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-5u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-5μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
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<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-10u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-10μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-10u/" class="_self" target="_self" >AIVR 10μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-15u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-15u/" class="_self" target="_self" >AIVR 15μ</a></h4></div></div>
<div class="col-md-4 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-25u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-25μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div></div></div>
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				<h1 class="et_pb_contact_main_title">Ask us for more information</h1>
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]]></content:encoded>
					
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			</item>
		<item>
		<title>VVR for MLB</title>
		<link>https://www.cims.com/vvr-for-mlb/</link>
					<comments>https://www.cims.com/vvr-for-mlb/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Mon, 04 Mar 2024 06:05:58 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[PCB HDI]]></category>
		<category><![CDATA[PCB MLB]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[15 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=11792</guid>

					<description><![CDATA[VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for MLB is optimized for verification of 25+ µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_28 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="300" height="300" src="https://www.cims.com/wp-content/uploads/2020/03/11-VVR-300px.png" alt="CIMS VVR" title="11 VVR-300px" class="wp-image-4825" /></span>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>Hybrid-mode AOI verification station for MLB PCB with min line/space down to 25+ µm.</h5>
<p>VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for MLB is designed to support high volume manufacturing of MLB PCB. <span>The systems within this series include the following models:</span></p>
<ul>
<li>VVR 25μ is optimized for verification of 25 µm line/space width technology</li>
<li>VVR 30μ is optimized for verification of 30 µm line/space width technology</li>
</ul>
<p>In VVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with advanced image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using VVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>VVR for MLB is compatible with all CIMS AOI.</p></div>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon"></span></span></div>
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						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 70% increase in verification efficiency vs. traditional mode</li>
<li>Displaying post-processed color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
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						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB<span>&#x2122;</span>/CDBIC<span>&#x2122;</span> &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight<span>&#x2122;</span> &#8211; enhanced video image</li>
</ul></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-5u/" class="_self" target="_self" >AIVR 5μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-10u/" class="_self" target="_self" >AIVR 10μ</a></h4></div></div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div></div></div>
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		<title>VVR for ICS</title>
		<link>https://www.cims.com/vvr-for-ics/</link>
					<comments>https://www.cims.com/vvr-for-ics/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 03 Mar 2021 07:36:14 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[IC Substrates]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[4 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=5608</guid>

					<description><![CDATA[VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for ICS is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_32 et_section_regular" >
				
				
				
				
				
				
				<div class="et_pb_row et_pb_row_32">
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				<div class="et_pb_module et_pb_image et_pb_image_8">
				
				
				
				
				<span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="300" height="300" src="https://www.cims.com/wp-content/uploads/2020/03/3-VVR-ICS-300px.png" alt="CIMS VVR ICS" title="3 VVR ICS-300px" class="wp-image-4781" /></span>
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			</div><div class="et_pb_column et_pb_column_2_3 et_pb_column_49  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
				<div class="et_pb_module et_pb_blurb et_pb_blurb_24  et_pb_text_align_left  et_pb_blurb_position_left et_pb_bg_layout_light">
				
				
				
				
				<div class="et_pb_blurb_content">
					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">b</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>Hybrid-mode AOI verification station for IC Substrates with min line/space down to 4 µm.</h5>
<p>VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for ICS is designed to support high volume manufacturing of IC Substrates. The systems within this series include the following models:</p>
<ul>
<li>VVR 4μ is optimized for verification of 4 µm line/space width technology</li>
<li>VVR 5μ is optimized for verification of 5 µm line/space width technology</li>
<li>VVR 7μ is optimized for verification of 7 µm line/space width technology</li>
<li>VVR 10μ is optimized for verification of 10 µm line/space width technology</li>
<li>VVR 15μ is optimized for verification of 15 µm line/space width technology</li>
</ul>
<p>In VVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with advanced image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using VVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>VVR for ICS is compatible with all CIMS AOI.</p></div>
					</div>
				</div>
			</div>
			</div>
				
				
				
				
			</div>
				
				
			</div><div class="et_pb_section et_pb_section_33 et_pb_with_background et_section_regular" >
				
				
				
				
				
				
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					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 70% increase in verification efficiency vs. traditional mode</li>
<li>Displaying post-processed color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
					</div>
				</div>
			</div>
			</div><div class="et_pb_column et_pb_column_1_2 et_pb_column_51  et_pb_css_mix_blend_mode_passthrough et-last-child">
				
				
				
				
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					<div class="et_pb_main_blurb_image"><span class="et_pb_image_wrap"><span class="et-waypoint et_pb_animation_off et_pb_animation_off_tablet et_pb_animation_off_phone et-pb-icon">Z</span></span></div>
					<div class="et_pb_blurb_container">
						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
					</div>
				</div>
			</div>
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<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-4u/" class="_self" target="_self" >AIVR 4μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-5u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-5μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-5u/" class="_self" target="_self" >AIVR 5μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-10u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-10μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-10u/" class="_self" target="_self" >AIVR 10μ</a></h4></div></div>
<div class="col-md-2 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-15u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-15μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-15u/" class="_self" target="_self" >AIVR 15μ</a></h4></div></div>
<div class="col-md-4 col-sm-6 col-xs-12 pt-cv-content-item pt-cv-1-col" ><div class='pt-cv-ifield'><a href="https://www.cims.com/aivr-25u/" class="_self pt-cv-href-thumbnail pt-cv-thumb-default" target="_self" ><img width="150" height="150" src="https://www.cims.com/wp-content/uploads/2024/07/AIVR-25μ-300x300-1-150x150.png" class="pt-cv-thumbnail" alt="" decoding="async" loading="lazy" /></a>
<h4 class="pt-cv-title"><a href="https://www.cims.com/aivr-25u/" class="_self" target="_self" >AIVR 25μ</a></h4></div></div></div></div>
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		<title>VVR for HDI</title>
		<link>https://www.cims.com/vvr-for-hdi/</link>
					<comments>https://www.cims.com/vvr-for-hdi/#respond</comments>
		
		<dc:creator><![CDATA[Angelnina He]]></dc:creator>
		<pubDate>Wed, 03 Mar 2021 07:36:12 +0000</pubDate>
				<category><![CDATA[AOI]]></category>
		<category><![CDATA[PCB HDI]]></category>
		<category><![CDATA[PCB MLB]]></category>
		<category><![CDATA[Verification]]></category>
		<category><![CDATA[15 micron]]></category>
		<category><![CDATA[AOI verification]]></category>
		<guid isPermaLink="false">https://www.cims.com/?p=5606</guid>

					<description><![CDATA[VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for HDI is designed to support high volume manufacturing of HDI and IC Substrates and optimized for verification of 15 ~ 30 µm line/space width technology.]]></description>
										<content:encoded><![CDATA[<p><div class="et_pb_section et_pb_section_36 et_section_regular" >
				
				
				
				
				
				
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				<span class="et_pb_image_wrap "><img decoding="async" loading="lazy" width="300" height="300" src="https://www.cims.com/wp-content/uploads/2020/03/7-VVR-HDI-300px.png" alt="CIMS VVR HDI" title="7 VVR HDI-300px" class="wp-image-4805" /></span>
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						<h4 class="et_pb_module_header"><span>Description</span></h4>
						<div class="et_pb_blurb_description"><h5>Hybrid-mode AOI verification station for HDI PCB with min line/space down to 15 µm.</h5>
<p>VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for HDI is designed to support high volume manufacturing of HDI PCB. <span>The systems within this series include the following models:</span></p>
<ul>
<li>VVR 15μ is optimized for verification of 15 µm line/space width technology</li>
<li>VVR 25μ is optimized for verification of 25 µm line/space width technology</li>
<li>VVR 30μ is optimized for verification of 30 µm line/space width technology</li>
</ul>
<p>In VVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with advanced image enhancement algorithms enabling quick filtering out obvious false calls.</p>
<p>Using VVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.</p>
<p>VVR for HDI is compatible with all CIMS AOI.</div>
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						<h4 class="et_pb_module_header"><span>Highlights</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Combines verification of AOI post-processed images with live video mode</li>
<li>Up to 70% increase in verification efficiency vs. traditional mode</li>
<li>Displaying post-processed color defects&#8217; images grabbed directly from AOI</li>
<li>Variable zoom and automated calibration</li>
<li>Stationary vacuum table</li>
<li>Ergonomic design</li>
<li>Clear defect image and adjustable video light</li>
</ul></div>
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						<h4 class="et_pb_module_header"><span>Options</span></h4>
						<div class="et_pb_blurb_description"><ul>
<li>Auto-marker for marking defects</li>
<li>Barcode reader</li>
<li>Adjustable monitor arm</li>
<li>CDB&#x2122;/CDBIC&#x2122; &#8211; defects classification and virtual defects mapping</li>
<li>SharpLight&#x2122; &#8211; enhanced video image</li>
</ul></div>
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