AVI 10 micron | CIMS https://www.cims.com Creativity in Motion Thu, 04 Jul 2024 05:38:22 +0000 en-US hourly 1 https://wordpress.org/?v=6.1.9 https://www.cims.com/wp-content/uploads/2017/08/cropped-CIMS-e1502874599572-32x32.png AVI 10 micron | CIMS https://www.cims.com 32 32 Galaxy Fi 10Cχ https://www.cims.com/galaxy-fi-10cx/ https://www.cims.com/galaxy-fi-10cx/#respond Mon, 19 Feb 2024 05:14:20 +0000 https://www.cims.com/?p=11638
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Description

Panel final inspection for advanced IC Substrates and ultra fine line HDI with min line/space down to 10 µm.

Galaxy Fi 10Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of advanced IC Substrates and ultra fine line HDI. It is equipped with color camera and capable to scan down to 10 µm line/space width technology.

The system’s state of the art optical technology for final inspection is designed to achieve maximum contrast on panels covered by solder mask resist and produced with various metal finishing processes. This technology supports high resolution image acquisition and ensures reliable detection of defects on plated copper, gold plated or OTC, solder mask and bare laminate.

Equipped with the state-of-the-art image acquisition and advanced software capabilities, the Galaxy product family is renowned for its exceptional detection achieved with lowest possible false calls rate.

Galaxy Fi 10Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Highlights

  • Linear motors for smooth & silent motion
  • Robust mechanical structure
  • Automated vacuum table
  • High performance image processing firmware
  • Next generation computer to process large data
  • Fast and intuitive setup for new jobs
  • Compatible with front/back AMHS automation or robot
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Options

  • +2DM™ metrology – panel dimensions measurement
  • +2CD™ metrology – 2D measurement of circuit elements
  • +3DH™ metrology – 3D measurements of circuit element’s height
  • +3DP™ metrology – 3D profiling of circuit element
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • X-WAVE™ – multi-wave illumination

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]]> https://www.cims.com/galaxy-fi-10cx/feed/ 0 SVS 10μ https://www.cims.com/svs-10u/ https://www.cims.com/svs-10u/#respond Mon, 19 Feb 2024 03:37:36 +0000 https://www.cims.com/?p=11578
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Description

AVI verification station for IC Substrates with min line/fingers down to 10 µm.

SVS 10µ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for verification of 10 ~ 18 µm line/fingers width technology.

The system’s state of the art illumination combines reflective/coaxial light channel with three separate diffusive channels to maximize contrast on gold surface as well as on solder mask. The optics design allows convenient marking of defects or scrapping defective units. Robust mechanics and powerful hardware ensure high throughput and efficiency.

SVS 10μ user friendly interface and superior ergonomics are designed for convenient and easy operation that requires only minimal training. It is also fully compatible with CDB™ and CDBIC™ – CIMS defects and scrapped units data management system.

SVS 10μ is compatible with all CIMS AVI systems as well as 3rd party laser marking machines.

Highlights

  • Flexible video light configurations
  • Automated material calibration
  • Stationary vacuum table
  • Ergonomic design
  • Optimized defect-to-defect movement
  • Clear defect image and adjustable video light
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Options

  • Barcode reader
  • Adjustable monitor position
  • CDB™/CDBIC™ – defects classification and virtual defects mapping

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]]> https://www.cims.com/svs-10u/feed/ 0 Capricorn 10Cχ https://www.cims.com/capricorn-10cx/ https://www.cims.com/capricorn-10cx/#respond Mon, 19 Feb 2024 03:14:25 +0000 https://www.cims.com/?p=11558
CIMS Capricorn 10x
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Description

AVI for IC Substrates with min line/space down to 10 µm.

Capricorn 10Cχ, CIMS latest generation AVI system, equipped with color camera, is designed for final inspection of advanced IC Substrates. It is capable to scan down to 10 µm line/space (2.9 μm optical pixel size) width technology.

Capricorn AVI systems feature dual stage and dual camera and is powered by the most advanced hardware and software offering high-capacity inspection along with greatly enhanced detection capabilities on both metal and solder mask.

Capricorn AVI systems are fully compatible with advanced Industry 4.0 requirements including scanning and handling barcode information, internal and external database connectivity, full compatibility with CIMS virtual verification system specifically designed for AVI inspection (VVS™/AVI) as well as supporting external data protocols for factory-wide smart factory integration.

Capricorn 10Cχ is powered by Spark™ 3.0 – an innovative cross-platform detection engine.

Highlights

  • Superior detection on both metal and solder mask
  • Detection of defects under solder mask
  • Inspection with multiple resolutions
  • 4 fully automated magazines
  • High performance image processing firmware
  • Powerful processors to handle large data
  • Easy and intuitive setup
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Options

  • Integrated automated strip cleaner
  • Barcode reading capability
  • Anti-static ionizer device
  • CDB™/CDBIC™ – defects classification and virtual defects mapping
  • X-WAVE™ ‒ multi-wave illumination
  • VVS™ ‒ virtual verification system
  • SECS/GEM™ connectivity

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