b Description Hybrid-mode AOI verification station for MLB PCB with min line/space down to 25+ µm. VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for MLB is designed to support high volume...
b Description AOI for IC Substrates with min line/space down to 4 µm. Galaxy 4Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of next generation IC Substrates. It is capable to scan down to 4 µm...
b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of highly advanced IC Substrates. It is capable to scan down to 5 µm...
b Description AOI for IC Substrates with min line/space down to 7 µm. Galaxy 7Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates. It is capable to scan down to 7 µm...
b Description AOI for IC Substrates and ultra fine line HDI with min line/space down to 10 µm. Galaxy 10Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates and ultra fine line...
