Quantum 2µ – the Ultimate Inspection Solution for 2 µm line/space IC Substrates

CIMS Quantum 2µ AOI is a revolutionary inspection solution for advanced IC substrates with lines and spaces as small as 2 µm. This system features submicron optical resolutions and incorporates cutting-edge technologies in illumination, image acquisition and processing, algorithms, and AI.

Quantum 2µ is a new family of CIMS products designed for inspection of advanced products requiring ultra-high resolutions, stable image acquisition, superior detection, and low false calls rate.

This system also includes Spark 4.0, CIMS’s latest generation of inspection engine with enhanced inspection and metrology capabilities, which represents a significant step forward and a new milestone in CIMS’s technological leadership in the industry.