Description
AI-powered AOI verification station for IC Substrates with min line/space down to 4 µm.
AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume manufacturing of IC Substrates and optimized for verification of 4 ~ 15 µm line/space width technology.
In AIVR mode, operator starts by reviewing defects’ images grabbed by AOI and processed with AI-based image enhancement algorithms enabling quick filtering out obvious false calls.
Using AIVR enables dramatic improvement in verification efficiency and speed while seamlessly integrating the results with the database. Moreover, users can easily classify defects using an optional touchscreen providing a critical feedback to QA in real time.
AIVR 4μ is compatible with all CIMS AOI.
Highlights
- Combines verification of AOI post-processed images with live video mode
- Up to 90% increase in verification efficiency vs. traditional mode
- Displaying AI-enhanced high resolution color defects’ images grabbed directly from AOI
- Variable zoom and automated calibration
- Stationary vacuum table
- Ergonomic design
- Clear defect image and adjustable video light
Options
- Auto-marker for marking defects
- Barcode reader
- Adjustable monitor arm
- CDB™/CDBIC™ – defects classification and virtual defects mapping
- SharpLight™ – enhanced video image
