Semiconductor wafer inspection

Semiconductor wafer inspection

Semiconductor 2D wafer inspection

Wafer 2D inspection

CIMS Evolution

Evolution XW

Evolution XW series is a high throughput automated wafer inspection solution capable of detecting all types of surface defects on patterned silicon wafers. It is powered by Blaze™ , CIMS latest generation detection engine for Semiconductor inspection equipment.

Got a question? Please, send us a message:

14 + 15 =