b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of highly advanced IC Substrates. It is capable to scan down to 5 µm...
b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5χ, CIMS AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 5 µm line/space width technology. The system’s state of the art optical...
b Description AOI verification station for IC Substrates with min line/space down to 5 µm. CVR 100 IC, CIMS verification station, is designed to support high volume manufacturing of IC Substrates. It is optimized for verification of 5 ~ 25 µm line/space width...
