Capricorn 15x

b Description AVI for IC Substrates with min line/space down to 15 µm. Capricorn 15x, CIMS latest generation multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 15 µm line/space width technology....

Capricorn 10x

b Description AVI for IC Substrates with min line/space down to 10 µm. Capricorn 10x, CIMS latest generation multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 10 µm line/space width technology....

Capricorn 8x

b Description AVI for IC Substrates with min line/space down to 8 µm. Capricorn 8x, CIMS latest generation AVI system, is designed for final inspection of high-end IC Substrates. It is capable to scan down to 8 µm line/space width technology. Capricorn AVI...

Unicorn 1800/Sharp

b Description AVI for IC Substrates with min line/space down to 4 µm. Unicorn 1800/Sharp, CIMS latest generation ultra-high resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 4 µm line/space width technology....

Galaxy 10χ

b Description AOI for IC Substrates and ultra fine line HDI with min line/space down to 10 µm. Galaxy 10χ, CIMS latest generation of AOI system, is designed to support high volume manufacturing of IC Substrates and ultra fine line HDI. It is capable to scan down...

Galaxy 7χ

b Description AOI for IC Substrates with min line/space down to 7 µm. Galaxy 7χ, CIMS latest generation of AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 7 µm line/space width technology. The system’s...

Galaxy 5χ

b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5χ, CIMS latest generation of AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 5 µm line/space width technology. The system’s...

Galaxy 4χ

b Description AOI for IC Substrates with min line/space down to 4 µm. Galaxy 4χ, CIMS latest generation of AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 4 µm line/space width technology. The system’s...

VVR for ICS

b Description AOI verification station for IC Substrates with min line/space down to 4 µm. VVR, CIMS verification station combines virtual and physical verification within a single workstation. VVR for ICS is designed to support high volume manufacturing of IC...

Unicorn 900/Sharp

b Description AVI for IC Substrates with min line/space down to 8 µm. Unicorn 900/Sharp, CIMS multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 8 µm line/space width technology. Unicorn AVI systems...

Unicorn 600/Sharp

b Description AVI for IC Substrates with min line/space down to 10 µm. Unicorn 600/Sharp, CIMS multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 10 µm line/space width technology. Unicorn AVI systems...

Unicorn 300/Sharp

b Description AVI for IC Substrates with min line/space down to 15 µm. Unicorn 300/Sharp, CIMS multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 15 µm line/space width technology. Unicorn AVI systems...

Unicorn 1200/Sharp

b Description AVI for IC Substrates with min line/space down to 5 µm. Unicorn 1200/Sharp, CIMS AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 5 µm line/space width technology. Unicorn AVI systems incorporate all CIMS...

VVR ICS

b Description AOI verification station for IC Substrates with min line/space down to 4 µm. VVR ICS, CIMS verification station combines virtual and physical verification within a single workstation. It is designed to support high volume manufacturing of IC...

Phoenix Ultima

b Description AOI for IC Substrates with min line/space down to 4 µm. Phoenix Ultima, CIMS latest generation of AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 4 µm line/space width technology. The system’s...

Phoenix Fi/ICS

b Description Panel final inspection for IC Substrates and ultra fine line HDI with min line/space down to 7 µm. Phoenix Fi/ICS, CIMS latest generation of AOI system, is designed to support final inspection of IC Substrates and ultra fine line HDI. It is capable...

Phoenix Nano

b Description AOI for IC Substrates with min line/space down to 5 µm. Phoenix Nano, CIMS AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 5 µm line/space width technology. The system’s state of the art...

Phoenix Micro

b Description AOI for IC Substrates with min line/space down to 7 µm. Phoenix Micro, CIMS AOI system, is designed to support high volume manufacturing of IC Substrates. It is capable to scan down to 7 µm line/space width technology. The system’s state of the art...

Phoenix Maxima

b Description AOI for IC Substrates and ultra fine line HDI with min line/space down to 10 µm. Phoenix Maxima, CIMS AOI system, is designed to support high volume manufacturing of IC Substrates and ultra fine line HDI. It is capable to scan down to 10 µm line/space...

Unicorn 1200/Turbo

b Description AVI for IC Substrates with min line/space down to 5 µm. Unicorn 1200/Turbo, CIMS latest generation multiple resolutions AVI system, is designed for final inspection of IC Substrates. It is capable to scan down to 5 µm line/space width technology....