b Description AI-powered AOI verification station for IC Substrates with min line/space down to 4 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 4μ is designed to support high volume...
b Description AI-powered AOI verification station for IC Substrates with min line/space down to 5 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 5μ is designed to support high volume...
b Description AI-powered AOI verification station for HDI and IC Substrates with min line/space down to 10 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 10μ is designed to support high...
b Description AI-powered AOI verification station for IC Substrates with min line/space down to 7 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 7μ is designed to support high volume...
b Description AI-powered AOI verification station for HDI and IC Substrates with min line/space down to 15 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 15μ is designed to support high...
b Description AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 25 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 25μ is designed to support...
b Description AI-powered AOI verification station for HDI and multi-layer PCB with min line/space down to 30 µm. AIVR, CIMS AI-powered verification station that combines virtual and physical verification within a single workstation. AIVR 30μ is designed to support...
b Description AOI for IC Substrates with min line/space down to 4 µm. Galaxy 4Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of next generation IC Substrates. It is capable to scan down to 4 µm...
b Description AOI for IC Substrates with min line/space down to 5 µm. Galaxy 5Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of highly advanced IC Substrates. It is capable to scan down to 5 µm...
b Description AOI for IC Substrates with min line/space down to 7 µm. Galaxy 7Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates. It is capable to scan down to 7 µm...
b Description AOI for IC Substrates and ultra fine line HDI with min line/space down to 10 µm. Galaxy 10Cχ, CIMS latest generation of AOI system, equipped with color camera, is designed to support high volume manufacturing of advanced IC Substrates and ultra fine line...
b Description AVI verification station for IC Substrates with min line/fingers down to 4 µm. SVS 4μ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
b Description AVI for IC Substrates with min line/space down to 5 µm. Capricorn 5Cχ, CIMS latest generation AVI system, equipped with color camera, is designed for final inspection of highly advanced IC Substrates. It is capable to scan down to 5 µm line/space (1.6 μm...
b Description AVI for IC Substrates with min line/space down to 4 µm. Capricorn 4Cχ, CIMS latest generation AVI system, equipped with color camera, is designed for final inspection of next generation IC Substrates. It is capable to scan down to 4 µm line/space (1 μm...
b Description Panel final inspection for highly advanced IC Substrates and ultra fine line HDI with min line/space down to 5 µm. Galaxy Fi 5Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of highly advanced IC Substrates...
b Description Panel final inspection for advanced IC Substrates and ultra fine line HDI with min line/space down to 7 µm. Galaxy Fi 7Cχ, CIMS latest panel based final inspection system, is designed to support final inspection of advanced IC Substrates and ultra fine...
b Description AVI verification station for IC Substrates with min line/fingers down to 10 µm. SVS 10µ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
b Description AVI verification station for IC Substrates with min line/fingers down to 15 µm. SVS 15µ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
b Description AVI verification station for IC Substrates with min line/fingers down to 8 µm. SVS 8μ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
b Description AVI verification station for IC Substrates with min line/fingers down to 5 µm. SVS 5μ, CIMS AVI verification station, powered by Sprint™, is designed for verification of IC Substrates strips scanned with AVI systems. It is optimized for...
