CIMS Press Release Galaxy X series – CIMS next generation of high resolution AOI for IC Substrates and HDI Galaxy χ series AOI systems represents the next generation ultra-high resolution technology that is capable to scan line width of down to 4 µm. Galaxy χ series...
CIMS will be exhibiting at CPCA 2021 in Shanghai, China. Please, visit us between July 7th and 9th. CPCA is one of the three major PCB shows in China that takes place in Shanghai. It is popular with Chinese and Taiwanese visitors but has a considerable attendance by...
b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 30 µm. Galaxy R2R 30µ, CIMS AOI system, is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 30 µm line/space width...
b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 25 µm. Galaxy R2R 25µ, CIMS AOI system, is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 25 µm line/space width...
b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 15 µm. Galaxy R2R 15µ, CIMS AOI system,is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 15 µm line/space width...
