Visit us in TPCA show 2021

CIMS will be exhibiting at TPCA 2021 in Shenzhen, China. Please, visit us between August 4th and 6th. TPCA China (formerly known as CTEX) is one of the three major PCB shows in China focusing on high end PCB manufacturing. This year, it will be taking place in...

New Product Launch

CIMS Press Release Galaxy X series – CIMS next generation of high resolution AOI for IC Substrates and HDI Galaxy χ series AOI systems represents the next generation ultra-high resolution technology that is capable to scan line width of down to 4 µm. Galaxy χ series...

Visit us in CPCA show 2021

CIMS will be exhibiting at CPCA 2021 in Shanghai, China. Please, visit us between July 7th and 9th. CPCA is one of the three major PCB shows in China that takes place in Shanghai. It is popular with Chinese and Taiwanese visitors but has a considerable attendance by...

Galaxy R2R 30μ

b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 30 µm. Galaxy R2R 30µ, CIMS AOI system, is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 30 µm line/space width...

Galaxy R2R 25μ

b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 25 µm. Galaxy R2R 25µ, CIMS AOI system, is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 25 µm line/space width...

Galaxy R2R 15μ

b Description AOI for inspection of FPC in roll-to-roll process with min line/space down to 15 µm. Galaxy R2R 15µ, CIMS AOI system,is designed to support roll-to-roll (R2R) manufacturing of flex and rigid-flex PCB. It is capable to scan down to 15 µm line/space width...

Galaxy Flex 25μ

b Description AOI for inspection of flex and rigid-flex with min line/space down to 25 µm. Galaxy Flex 25μ, CIMS AOI system, is designed to support high volume manufacturing of flex and rigid-flex PCB. It is capable to scan down to 25 µm line/space width technology....

Galaxy Flex 30μ

b Description AOI for inspection of flex and rigid-flex with min line/space down to 30 µm. Galaxy Flex 30μ, CIMS AOI system, is designed to support high volume manufacturing of flex and rigid-flex PCB. It is capable to scan down to 30 µm line/space width technology....

Galaxy Flex 15μ

b Description AOI for inspection of flex and rigid-flex with min line/space down to 15 µm. Galaxy Flex 15μ, CIMS AOI system, is designed to support high volume manufacturing of flex and rigid-flex PCB. It is capable to scan down to 15 µm line/space width technology....

Galaxy LV series

b Description AOI systems for laser via inspection with min diameter down to 10 µm. Galaxy LV series represent the family of models designed to support inspection of blind laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems within this...