b Description AOI for HDI and multi-layer PCB with min line/space down to 30 µm. Galaxy 30μ, CIMS AOI system, is designed to support high volume manufacturing of HDI and multi-layer PCB. It is capable to scan down to 30 µm line/space width technology. The system’s...
b Description AOI for HDI and multi-layer PCB with min line/space down to 25 µm. Galaxy 25μ, CIMS AOI system, is designed to support high volume manufacturing of HDI and high-end multi-layer PCB. It is capable to scan down to 25 µm line/space width technology. The...
b Description AOI for HDI and fine line PCB with min line/space down to 15 µm. Galaxy 15μ, CIMS AOI system, is designed to support high volume manufacturing of advanced HDI and fine line PCB. It is capable to scan down to 15 µm line/space width technology. The...
b Description Hybrid-mode AOI verification station for IC Substrates with min line/space down to 4 µm. VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for ICS is designed to support high...
b Description Hybrid-mode AOI verification station for HDI PCB with min line/space down to 15 µm. VVR, CIMS hybrid-mode verification station that combines virtual and physical verification within a single workstation. VVR for HDI is designed to support high volume...
b Description AOI system for plugged via holes (PVH) inspection with min diameter down to 75 µm. Galaxy PVH is designed to inspect plugged via holes that are typically filled with resin in high volume manufacturing of MLB and HDI PCB. The process of plugging drills...
Message from CEO In light of these unprecedented times, I wanted to share an update on the situation in CIMS and the status of our commitments to our global partners. Our operations and production capacity are at 100% as well as our global pre-sales and post-sales...
b Description PVH option is an add-on functionality for selected CIMS AOI models enabling inspection of plugged via holes down to 75 microns in diameter. This new system further extends CIMS line of products an options for drill inspection applications. The...
b Description CQC, which stands for CIMS Quality Center, is the live quality monitoring tool that allows users to have an up-to-the-minute view of ongoing quality-related issues based on data generated by AOI in real time. How does CQC work? CQC is a software...
b Description AOI systems for through laser via inspection with min diameter down to 20 µm. Galaxy VIA series represent the family of models designed to support inspection of through laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems...
