b Description AOI for large panel inspection with min line/space down to 40 µm. Phoenix LT, CIMS AOI system, is designed for inspection of large panel of up to 36″ x 42″ (914 mm x 1,067 mm). It is capable to scan down to 40 µm line/space width technology....
b Description AOI for inspection of mechanical drills down to 150 µm in diameter. Phoenix MDI, CIMS AOI system, is designed for inspection of mechanical drills on HDI and multi-layer PCB. It is capable to scan mechanical drills down to 150 µm in diameter. The system’s...
b Description AOI for inspection of touch screen panels down to 25 µm line/space width. Phoenix Touch, CIMS AOI system, is designed for inspection of conductors on touch screen panels. It is capable to scan down to 25 µm line/space width technology. The system’s state...
b Description AOI for ultra fine line photo-tools with min line/space down to 7 µm. Phoenix PT/Micro, CIMS AOI system, is designed to inspect ultra fine line photo-tools such as film artworks as well as glass mask. It is capable to scan down to 7 µm line/space width...
b Description AOI for high-res photo-tools with min line/space down to 12.5 µm. Phoenix PT+, CIMS AOI system, is designed to inspect high-res photo-tools such as film artworks as well as glass mask. It is capable to scan down to 12.5 µm line/space width technology....
