Galaxy PVH

b Description AOI system for plugged via holes (PVH) inspection with min diameter down to 75 µm. Galaxy PVH is designed to inspect plugged via holes that are typically filled with resin in high volume manufacturing of MLB and HDI PCB. The process of plugging...

PVH- Plugged Via Holes Inspection

b Description PVH option is an add-on functionality for selected CIMS AOI models enabling inspection of plugged via holes down to 75 microns in diameter. This new system further extends CIMS line of products an options for drill inspection applications. The...

CQC – CIMS Quality Center

b Description CQC, which stands for CIMS Quality Center, is the live quality monitoring tool that allows users to have an up-to-the-minute view of ongoing quality-related issues based on data generated by AOI in real time. How does CQC work? CQC is a software...

Galaxy VIA series

b Description AOI systems for through laser via inspection with min diameter down to 20 µm. Galaxy VIA series represent the family of models designed to support inspection of through laser via in high volume manufacturing of advanced HDI or IC Substrates. The...

Phoenix LV series

b Description AOI systems for laser via inspection with min diameter down to 15 µm. Phoenix LV series represent the family of models designed to support inspection of blind laser via in high volume manufacturing of advanced HDI or IC Substrates. The systems within...