b Description 3D metrology is CIMS technology for accurate three-dimensional measurements of individual elements of a PCB circuit. 3D metrology options can also be integrated with selected CIMS AOI systems providing a live control loop for the purposes of quality...
b Description 2D metrology is CIMS technology for accurate measurements taken on the surface of a PCB. 2D metrology options are integrated with CIMS AOI systems becoming a part of inspection cycle, eliminating the need for a separate process. CIMS offers two types of...
b Description CIMS LDI is a laser drill inspection option designed for HDI PCB and IC Substrates. It is supplied as an add-on option suitable for all CIMS Phoenix family AOI models capable of inspecting laser drills of all sizes (subject to base system’s...
Upcoming event TPCA 2017 CIMS will exhibit at TPCA 2017 taking place in Taiwan between Oct 25 and 27. Please, visit our booth (I421) in Nangang Exhibition Center. See you in...
b Description Fi (Final Inspection) option allows inspecting of finished boards with CIMS AOI. It is supplied as an add-on option suitable for all CIMS Phoenix family AOI models extending their capabilities to final inspection. Fi can reliably detect common...
b Description CDB and CDBIC are data management systems integrated with CIMS equipment. They are designed for quality and process control of the entire PCB inspection production cycle while also serving as real time defects classification system. CDB brings...
b Description AOI for large panel inspection with min line/space down to 40 µm. Phoenix LT, CIMS AOI system, is designed for inspection of large panel of up to 36″ x 42″ (914 mm x 1,067 mm). It is capable to scan down to 40 µm line/space width technology....
b Description AOI for inspection of mechanical drills down to 150 µm in diameter. Phoenix MDI, CIMS AOI system, is designed for inspection of mechanical drills on HDI and multi-layer PCB. It is capable to scan mechanical drills down to 150 µm in diameter. The system’s...
b Description AOI for inspection of touch screen panels down to 25 µm line/space width. Phoenix Touch, CIMS AOI system, is designed for inspection of conductors on touch screen panels. It is capable to scan down to 25 µm line/space width technology. The system’s state...
b Description AOI for ultra fine line photo-tools with min line/space down to 7 µm. Phoenix PT/Micro, CIMS AOI system, is designed to inspect ultra fine line photo-tools such as film artworks as well as glass mask. It is capable to scan down to 7 µm line/space width...
